In a recent article published in Science Advances, we demonstrate scattering-type near-field optical microscopy (s-SNOM) based on low-temperature non-contact atomic force microscopy (nc-AFM). This resulted from a strong collaboration with Melanie Müller’s group in Department of Physical Chemistry and Electron Microscopy group in Department of Inorganic Chemistry. An ultralow tip-oscillation amplitude driven by a nc-AFM qPlus sensor allows for the sensitive detection of a plasmonic near-field localized in a narrow Ag-Ag gap. The nc-AFM-based s-SNOM achieves 1-nm resolution, surpassing the conventional s-SNOM resolutions.