We are happy to announce that our collaborative work on the development of s-SNOM based on nc-AFM – utilizing ultralow tip oscillation amplitudes and detecting the elastic light scattering from ultraconfined fields localized at the 1-nm-scale – is now published in Science Advances. Using a silver tip under visible laser illumination with a constant 1-nm amplitude oscillation, we obtain a material-contrast image of silicon islands on a silver surface with 1 nm lateral resolution, surpassing the conventional limits of s-SNOM. These achievements pave the way for the acquisition of optical information from atomic-scale structures, such as single photo-active defects and molecules. You find the paper here: Sci. Adv. 11, eadu1415 (2025)